AVT, HP to display integrated inspection solution at LabelExpo Americas

THE AVT Helios S Turbo, a high resolution, high speed, 100 percent inspection system integrated with the HP Indigo 8000 Digital Press will be on showcase at HP booth 3226/3429 at LabelExpo Americas, taking place in Chicago from 13-15 September  2016.

Visitors to the booth will see how the inspection solution connects with the press, automatically pausing printing when detecting a suspected repeating problem. The real time feedback ensures minimal waste and immediate action to resolve the problem, for a smooth production flow.  The system can be integrated at the end of the press or after the inline finishing unit.

“We are excited to introduce our first integrated, closed loop solution for the HP Indigo 8000 press,” said Guy Yogev, Marketing Director at AVT. “Considering the press’ high production throughput, the need for tighter control and immediate reporting feedback has increased dramatically.  This solution, designed and delivered in close partnership with HP Indigo, reflects these market needs and provides added value features and abilities to customers”  

The AVT Apollo 20K system will also be demonstrated as part of the HP Indigo 20000 Digital Press, offering 100 percent inspection with various process control and color monitoring features, as well as advanced workflow options.

With AVT’s ZeroSet feature, users of the AVT systems can set up and auto initiate inspection jobs from their Esko Automation Engine, providing seamless quality assurance while changing jobs on the fly.

AVT provides dedicated 100 percent inspection solutions to HP Indigo Labels, Packaging and Folding Carton presses.  In addition to the aforementioned solutions, recent collaborations also include a system designed for the HP Indigo 30000 Digital Press for folding cartons.  The dedicated end-to-end solution offers 100 percent sheet inspection with various workflows – including both full sheet ejection and single pack ejection for optimal quality and automation.