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HR-R 8-1 – forward-thinking magnetic near-field probe up to 40 GHz

Source:Langer EMV-Technik GmbH Release Date:2023-05-03 310
Semiconductor/Electronic ChipSemiconductor / Electronic Chip
The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement and analysis tool for research and development of electronic assemblies and RF structures.
The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement
and analysis tool for research and development of electronic assemblies and RF structures. It is used
in the fields of Industry 4.0, IoT, automotive or robotics. The near-field probe enables RF
measurements on traces, individual components or ICs.
With its sensitivity in the RF range up to 40 GHz in the near field, the passive probe enables analyses
during development that were not possible before. The HR-R 8-1 magnetic field probe provides
information on the emissions of interference and the associated influence of electromagnetic fields on
neighboring assemblies - these findings can contribute to a more cost-efficient design in the
development process.

To achieve the probe's characteristic values, the development team of Langer-EMV Technik paid
particular attention to a combination of head size and short signal paths in the probe head. As a result,
this near-field probe offers a particularly high H-field sensitivity.
For spatially reproducible measurements, the probe can be used in an automatic positioning system,
for example in a Langer scanner. The probe is therefor used with the SH 01 probe holder in the
Langer scanner.

Precision handcrafted in Germany, the H-field probe is supplied in a set consisting of the HR-R 8-1
probe, the operating manual and the USB stick with probe characteristics.
For more information on the HR-R 8-1 near-field probe, please visit our website:
https://www.langer-emv.de/en/product/hr-passiv-bis-40-ghz/107/hr-r-8-1-set-nahfeldsondenset-bis-40-
ghz-b-feld/1379
The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement
and analysis tool for research and development of electronic assemblies and RF structures. It is used
in the fields of Industry 4.0, IoT, automotive or robotics. The near-field probe enables RF
measurements on traces, individual components or ICs.
With its sensitivity in the RF range up to 40 GHz in the near field, the passive probe enables analyses
during development that were not possible before. The HR-R 8-1 magnetic field probe provides
information on the emissions of interference and the associated influence of electromagnetic fields on
neighboring assemblies - these findings can contribute to a more cost-efficient design in the
development process.

To achieve the probe's characteristic values, the development team of Langer-EMV Technik paid
particular attention to a combination of head size and short signal paths in the probe head. As a result,
this near-field probe offers a particularly high H-field sensitivity.
For spatially reproducible measurements, the probe can be used in an automatic positioning system,
for example in a Langer scanner. The probe is therefor used with the SH 01 probe holder in the
Langer scanner.

Precision handcrafted in Germany, the H-field probe is supplied in a set consisting of the HR-R 8-1
probe, the operating manual and the USB stick with probe characteristics.
For more information on the HR-R 8-1 near-field probe, please visit our website:
https://www.langer-emv.de/en/product/hr-passiv-bis-40-ghz/107/hr-r-8-1-set-nahfeldsondenset-bis-40-
ghz-b-feld/1379
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The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement and analysis tool for research and development of electronic assemblies and RF structures. It is used in the fields of Industry 4.0, IoT, automotive or robotics. The near-field probe enables RF measurements on traces, individual components or ICs.  With its sensitivity in the RF range up to 40 GHz in the near field, the passive probe enables analyses during development that were not possible before. The HR-R 8-1 magnetic field probe provides information on the emissions of interference and the associated influence of electromagnetic fields on neighboring assemblies - these findings can contribute to a more cost-efficient design in the development process.

To achieve the probe's characteristic values, the development team of Langer-EMV Technik paid particular attention to a combination of head size and short signal paths in the probe head. As a result, this near-field probe offers a particularly high H-field sensitivity. For spatially reproducible measurements, the probe can be used in an automatic positioning system, for example in a Langer scanner. The probe is therefor used with the SH 01 probe holder in the
Langer scanner.

Precision handcrafted in Germany, the H-field probe is supplied in a set consisting of the HR-R 8-1 probe, the operating manual and the USB stick with probe characteristics.  For more information on the HR-R 8-1 near-field probe, please visit our website:  
https://www.langer-emv.de/en/product/hr-passiv-bis-40-ghz/107/hr-r-8-1-set-nahfeldsondenset-bis-40-
ghz-b-feld/1379

The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement
and analysis tool for research and development of electronic assemblies and RF structures. It is used
in the fields of Industry 4.0, IoT, automotive or robotics. The near-field probe enables RF
measurements on traces, individual components or ICs.
With its sensitivity in the RF range up to 40 GHz in the near field, the passive probe enables analyses
during development that were not possible before. The HR-R 8-1 magnetic field probe provides
information on the emissions of interference and the associated influence of electromagnetic fields on
neighboring assemblies - these findings can contribute to a more cost-efficient design in the
development process.

To achieve the probe's characteristic values, the development team of Langer-EMV Technik paid
particular attention to a combination of head size and short signal paths in the probe head. As a result,
this near-field probe offers a particularly high H-field sensitivity.
For spatially reproducible measurements, the probe can be used in an automatic positioning system,
for example in a Langer scanner. The probe is therefor used with the SH 01 probe holder in the
Langer scanner.

Precision handcrafted in Germany, the H-field probe is supplied in a set consisting of the HR-R 8-1
probe, the operating manual and the USB stick with probe characteristics.
For more information on the HR-R 8-1 near-field probe, please visit our website:
https://www.langer-emv.de/en/product/hr-passiv-bis-40-ghz/107/hr-r-8-1-set-nahfeldsondenset-bis-40-
ghz-b-feld/1379
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