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ringier-盛鈺精機有限公司

Manufacturing Indonesia 2014: Carl Zeiss CONTURA G2 offers high-speed scanning

Source:Ringier Metalworking Release Date:2014-12-03 256
MetalworkingSemiconductor/Electronic ChipSemiconductor / Electronic Chip
Zeiss presents CONTURA G2 that ensures reproducibly precise measuring results and allows for the option of passive or active technology.
Carl Zeiss is highlighting its CMM that brought active scanning to small and midsize manufacturers offer greater flexibility and accuracy. The robust machine design of CONTURA G2 ensures reproducibly precise measuring results and allows for the option of passive or active technology. CONTURA G2 RDS VAST XXT is optimally used for measuring complex features and parts with multiple angles that require very small styli, as ZEISS RDS articulating probe holder can reach 20,376 positions in 2.5o increments. CONTURA G2 Active on the other hand is great for multi-point measurement. It allows the use of complex stylus systems and is optimally used for measuring deep, offset features or projected tolerance zones over long distances with high throughput. 

Booth No.: D-8617

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