O-INSPECT 322
O-INSPECT 332. Also shown: Adjustable transmitted light pallet, calibration pallet, and 3x stylus rack.
O-INSPECT 322 comes standard with contact sensors – and also includes ZEISS scanning. The optical and contact sensors are integrated, the convenient CALYPSO 3D CAD software merges the measurement data, thus ensuring that users trust in the reliability of their measuring results.
3D from the start
Where other machines can only offer single-point scanning and thus relatively high probing forces, O-INSPECT 322 offers scanning as a standard feature, in which the VAST XXT probe enables precision probing with forces in the millinewton range. Therefore, true 3D measurements with form and position statements are possible.
Telecentric optics
Telecentric optics are elaborate and therefore not used on most optical measuring machines.Unlike conventional optics, the distance to the object is irrelevant in telecentrics: test objects with different material thicknesses in the camera image can always be measured with the right imaging scale.
O-INSPECT comes standard with the 12x telecentric Discovery zoom lens from microscopy, which compensates for these deviations with an additional zoom range. Outstanding image quality is ensured by the lens and the adaptive illumination system which provides transmitted light as well as several reflected lights at different angles, each with red and blue light. The illumination can be perfectly adapted to the form and color of the test object.
Precise even under challenging temperature conditions
O-INSPECT is very insensitive to different ambient temperatures. Where other machines need climate-controlled measuring labs, O-INSPECT delivers reliable measuring results at a wide range of temperatures and can therefore also be deployed on the shop floor.
Various pallets are also optionally available. They can be used in the standard pallet loading system in the glass frame to ensure maximum flexibility.
Instrumentation
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Discovery telecentric zoom lens
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Adaptive illumination system
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VAST XXT scanning sensor
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Stylus rack
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Reference sphere
Options
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Loading system with glass pallet and hole grid pallet
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Calibration pallet
Software

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