PowerINSPECT makes complex inspections faster, easier

THE new version includes more options for automation of inspection sequences, including automated probe changes, automatic feature extraction for point cloud batch inspection, and greater control over collision checking. 

For full details, including video demonstrations of the new options, please go to www.delcam.tv/pi2015/lz/en/

The main improvement for users of CNC CMMs is the addition of support for MCR20 and FCR25 probe change racks.  PowerINSPECT can now incorporate probe changes into fully-automated measurement sequences.  Enhancements to the probe database allow the user to define probe tools in terms of ‘sub-assemblies’ which can be docked in the rack ports.  A typical example of a sub-assembly is the combination of a probe module and a stylus.

Once created, the sub-assemblies are allocated to specific ports in the probe change rack, and the user defines the physical location of the rack on the CMM by measurement.  PowerINSPECT carries out probe changes as required by the measurement sequence and keeps track of the sub-assemblies as they move between the probe head and probe rack.

A new ‘zoom-to-fit’ option is available that shows, in the CAD view, groups or individual items that have been selected in the sequence tree.  This option will save considerable time, especially when locating specific features in large, complex CAD models or long measurement sequences.