ZEISS has collaborated with DMG Mori Seiki in a two-day metrology seminar on coordinate measuring machine, CMM measurement and GD&T inspection on CMM in March 2014.
Insightful metrology topics, such as Material Inspection, Enhancing Productivity of CMM, GD&T Form and Measuring Strategies were discussed. The seminar involved both theoretical knowledge sharing as well as practical hands-on session.
Educational institution and government agencies such as Rajamangala University of Technology Suvarnabhumi (RMUTSB), the National Institute of Metrology Thailand (NIMT), and the Thai-German Institute (TGI) expressed support by sending key persons to grace and add value to the event. The president of RMUTSB gave an opening speech to kick start the two day metrology seminar; Assistant Professor Patiyan Suthivate, a member of the Society of Metrologists, presented on “How to Read the Drawing”, and the head of Metrology of NIMT, Mr Anusorn, sent their metrologist, Dr Narin Janthawong, to present on “Length and Traceability of CMM”.
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