Chunghwa Precision Test Tech. Co., Ltd.

CHPT began providing semiconductor test-interface services in 2001 as part of the high-speed PCB team at Chunghwa Telecom Laboratories. The independent company was established in 2005 and subsequently expanded its high-speed circuit-board capabilities into wafer probe cards and packaged-device test boards.

During wafer testing, a probe card electrically connects automatic test equipment to pads or bumps on individual dies. As advanced semiconductor devices incorporate more contacts, finer pitches, higher frequencies and greater power requirements, probe cards must combine high-density interconnection, precision mechanics, thermal stability and high-speed electrical performance.

CHPT employs an All-in-House development and manufacturing model integrating mechanical, electronic, chemical and optical technologies. Its internal capabilities cover MEMS probes, probe heads, substrates, high-density PCBs, complete probe-card assembly, measurement and validation.

For final and system-level testing, the company supplies IC load boards and memory DUT boards. These products combine high-layer-count PCB technologies with signal-integrity analysis, power-integrity analysis, three-dimensional electromagnetic simulation and measurement validation.

The company’s principal value is its ability to provide integrated semiconductor test-interface solutions based on internally developed probes, probe heads, substrates and high-performance PCBs. Product configurations can be adjusted according to device layout, pad pitch, frequency, test temperature, current, pin count and test-platform requirements.